Power electronics
technology of an energy efficient future
System develpoment
innovative ideas with concept
Test benches
Resonant switching IPM
Less switching losses, high switching frequencies
LED driver
energy efficiency with wide output power range

Power cycling test bench for power semiconductors

Active power cycling tests according to IEC 60749-34 or the automotive standard LV 324 are an important test procedure to determine the reliability of power semiconductors. Through repeatedly active heating of the semiconductor by a load current and the subsequent cooling phase, the assembly and packaging technology of the semiconductor is subjected to thermo-mechanical stress and aging. The number of cycles before reaching the failure criteria is an important qualifier for the reliability of the power semiconductors.

Power cycling test bench PCTB-D

The power cycling test bench PCTB-D was designed by alpitronic for conducting active power cycling tests. It provides high flexibility through a wide spectrum of power classes and module types as well as extensive possibilities to monitor the essential parameters of the module integrity during test run.


  • Load power generation up to 1200 A
  • Contemporaneous testing of up to 12 DUTs (power semiconductor modules with base plate or pin-fin modules)
  • Load current pulse duration from 0.5 s to 150 s
  • Cooling water temperatures from 25°C to 120°C.
  • Adjustable gate voltage -8V-20 V
  • Recording of the calibration curve for determining the junction temperature for each unit under test
  • Failure criteria: VCE / Vf voltage, delta of junction temperature ΔTj, thermal resistance Rth (percentage increase)
  • Recording the characteristic performance data for each cycle, as well as periodic or event-triggered recording of waveforms of selected cycles (50 ms timebase)

Detailed information on the Power Cycling Test Bench:

Product datasheet